Actions:

#01. Sample extraction from the vacuum desiccator
#02. Fragmentation of the solid component
#03. Placement of the sample on a STUB
#04. Insertion into the SEM’s chamber
#05. Image acquisition and focusing
#06. Sample composition analysis

SEM stands for Scanning Electron Microscope, a powerful analytical tool. Unlike an optical microscope, which uses light, the SEM uses electrons as a radiation.
This difference, along with providing an outstaning image resolution, allows for a deeper analysis of the matter—not just identifying what is present but also understanding how it is structured. Electrons generate physical interactions that help not only visualize the surface but also analyze its composition in detail.

A beam of electrons is extracted from the source, focused, and accelerated by the microscope’s electromagnetic lenses toward the sample surface. These electrons interact with the outermost layer of the material, causing the emission of other electrons that carry valuable information about the sample.

In ceramics, for example, the SEM is widely used to analyze defects (pinholes, re-boiling phenomena, black core, etc.), verify the composition of materials, detect specific elements, and optimize formulations. The detailed data it provides is essential for solving various issues affecting both ceramic products and processes.

NOTE – Once prepared, the sample is placed on an aluminum stub covered with a carbon adhesive and then introduced into the chamber of the microscope.